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byAK and the research community

Aug 7

Characterizing Soft-Error Resiliency in Arm's Ethos-U55 Embedded Machine Learning Accelerator

As Neural Processing Units (NPU) or accelerators are increasingly deployed in a variety of applications including safety critical applications such as autonomous vehicle, and medical imaging, it is critical to understand the fault-tolerance nature of the NPUs. We present a reliability study of Arm's Ethos-U55, an important industrial-scale NPU being utilised in embedded and IoT applications. We perform large scale RTL-level fault injections to characterize Ethos-U55 against the Automotive Safety Integrity Level D (ASIL-D) resiliency standard commonly used for safety-critical applications such as autonomous vehicles. We show that, under soft errors, all four configurations of the NPU fall short of the required level of resiliency for a variety of neural networks running on the NPU. We show that it is possible to meet the ASIL-D level resiliency without resorting to conventional strategies like Dual Core Lock Step (DCLS) that has an area overhead of 100%. We achieve so through selective protection, where hardware structures are selectively protected (e.g., duplicated, hardened) based on their sensitivity to soft errors and their silicon areas. To identify the optimal configuration that minimizes the area overhead while meeting the ASIL-D standard, the main challenge is the large search space associated with the time-consuming RTL simulation. To address this challenge, we present a statistical analysis tool that is validated against Arm silicon and that allows us to quickly navigate hundreds of billions of fault sites without exhaustive RTL fault injections. We show that by carefully duplicating a small fraction of the functional blocks and hardening the Flops in other blocks meets the ASIL-D safety standard while introducing an area overhead of only 38%.

Continual Learning with Dynamic Sparse Training: Exploring Algorithms for Effective Model Updates

Continual learning (CL) refers to the ability of an intelligent system to sequentially acquire and retain knowledge from a stream of data with as little computational overhead as possible. To this end; regularization, replay, architecture, and parameter isolation approaches were introduced to the literature. Parameter isolation using a sparse network which enables to allocate distinct parts of the neural network to different tasks and also allows to share of parameters between tasks if they are similar. Dynamic Sparse Training (DST) is a prominent way to find these sparse networks and isolate them for each task. This paper is the first empirical study investigating the effect of different DST components under the CL paradigm to fill a critical research gap and shed light on the optimal configuration of DST for CL if it exists. Therefore, we perform a comprehensive study in which we investigate various DST components to find the best topology per task on well-known CIFAR100 and miniImageNet benchmarks in a task-incremental CL setup since our primary focus is to evaluate the performance of various DST criteria, rather than the process of mask selection. We found that, at a low sparsity level, Erdos-Renyi Kernel (ERK) initialization utilizes the backbone more efficiently and allows to effectively learn increments of tasks. At a high sparsity level, however, uniform initialization demonstrates more reliable and robust performance. In terms of growth strategy; performance is dependent on the defined initialization strategy, and the extent of sparsity. Finally, adaptivity within DST components is a promising way for better continual learners.